"Characterization and modeling of hot carrier injection in LDMOS for L-band ..."

Loïc Lachèze et al. (2011)

> Home

Details and statistics

DOI: 10.1016/J.MICROREL.2011.03.040

access: closed

type: Journal Article

metadata version: 2022-10-02

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/LachezeLDMPMSCE11
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/LachezeLDMPMSCE11
Loïc Lachèze, Olivier Latry, Pascal Dherbécourt, Karine Mourgues, V. Purohit, Hichame Maanane, Jean Pierre Sipma, F. Cornu, Philippe Eudeline:
Characterization and modeling of hot carrier injection in LDMOS for L-band radar application. Microelectron. Reliab. 51(8): 1289-1294 (2011)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.