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"Electrical probing of deep sub-micron integrated circuits using scanning ..."

K. Krieg, Douglas J. Thomson, Gregory E. Bridges (2001)

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DOI: 10.1016/S0026-2714(00)00234-1

access: closed

type: Journal Article

metadata version: 2020-02-22

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K. Krieg, Douglas J. Thomson, Gregory E. Bridges:
Electrical probing of deep sub-micron integrated circuits using scanning probes. Microelectron. Reliab. 41(8): 1185-1191 (2001)

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