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"A compact model for NBTI degradation and recovery under use-profile ..."
Veit B. Kleeberger et al. (2014)
- Veit B. Kleeberger
, Martin Barke, Christoph Werner, Doris Schmitt-Landsiedel, Ulf Schlichtmann
:
A compact model for NBTI degradation and recovery under use-profile variations and its application to aging analysis of digital integrated circuits. Microelectron. Reliab. 54(6-7): 1083-1089 (2014)
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