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"Reliability of amorphous InGaZnO TFTs with ITO local conducting buried ..."

Hyun Jong Kim et al. (2017)

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DOI: 10.1016/J.MICROREL.2017.06.023

access: closed

type: Journal Article

metadata version: 2022-04-21

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Hyun Jong Kim, Byung Sang Song, Won-Ju Cho, Jong Tae Park:
Reliability of amorphous InGaZnO TFTs with ITO local conducting buried layer for BEOL power transistors. Microelectron. Reliab. 76-77: 333-337 (2017)

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