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"Effect of OFF-state stress on reliability of nMOSFET in SWD circuits of DRAM."

Jongkyun Kim et al. (2018)

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DOI: 10.1016/J.MICROREL.2018.06.101

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/KimLKLSL18
Jongkyun Kim, Namhyun Lee, Gang-Jun Kim, Young-Yun Lee, Jung-Eun Seok, Yunsung Lee:
Effect of OFF-state stress on reliability of nMOSFET in SWD circuits of DRAM. Microelectron. Reliab. 88-90: 183-185 (2018)

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