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"Thickness and temperature dependence of the leakage current in ..."
Jiseok Kim et al. (2012)
- Jiseok Kim, Siddarth A. Krishnan, Sudarshan Narayanan, Michael P. Chudzik, Massimo V. Fischetti
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Thickness and temperature dependence of the leakage current in hafnium-based Si SOI MOSFETs. Microelectron. Reliab. 52(12): 2907-2913 (2012)
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