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"Effects of oxidation on reliability of screen-printed silver circuits for ..."

Dae Up Kim, Kwang-Seok Kim, Seung-Boo Jung (2016)

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DOI: 10.1016/J.MICROREL.2016.05.016

access: closed

type: Journal Article

metadata version: 2020-10-26

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Dae Up Kim, Kwang-Seok Kim, Seung-Boo Jung:
Effects of oxidation on reliability of screen-printed silver circuits for radio frequency applications. Microelectron. Reliab. 63: 120-124 (2016)

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