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"Reliability of High-K Dielectrics and Its Dependence on Gate Electrode and ..."
Y. H. Kim et al. (2004)
- Y. H. Kim, Rino Choi
, R. Jha, J. H. Lee, Veena Misra
, J. C. Lee:
Reliability of High-K Dielectrics and Its Dependence on Gate Electrode and Interfacial / High-K Bi-Layer Structure. Microelectron. Reliab. 44(9-11): 1513-1518 (2004)
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