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"Reliability study of AlGaN/GaN HEMT under electromagnetic, RF and DC stress."

Samh Khemiri, Moncef Kadi, Anne Louis (2011)

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DOI: 10.1016/J.MICROREL.2011.07.074

access: closed

type: Journal Article

metadata version: 2021-04-29

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Samh Khemiri, Moncef Kadi, Anne Louis:
Reliability study of AlGaN/GaN HEMT under electromagnetic, RF and DC stress. Microelectron. Reliab. 51(9-11): 1783-1787 (2011)

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