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"Effect of NBTI/PBTI aging and process variations on write failures in ..."

Usman Khalid, Antonio Mastrandrea, Mauro Olivieri (2015)

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DOI: 10.1016/J.MICROREL.2015.07.050

access: closed

type: Journal Article

metadata version: 2020-02-22

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Usman Khalid, Antonio Mastrandrea, Mauro Olivieri:
Effect of NBTI/PBTI aging and process variations on write failures in MOSFET and FinFET flip-flops. Microelectron. Reliab. 55(12): 2614-2626 (2015)

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