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"Robust, versatile, direct low-frequency noise characterization method for ..."

A. Kerlain, V. Mosser (2005)

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DOI: 10.1016/J.MICROREL.2005.07.015

access: closed

type: Journal Article

metadata version: 2020-02-22

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A. Kerlain, V. Mosser:
Robust, versatile, direct low-frequency noise characterization method for material/process quality control using cross-shaped 4-terminal devices. Microelectron. Reliab. 45(9-11): 1327-1330 (2005)

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