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"Assessment of sense measurement duration on BTI degradation in MG/HK CMOS ..."

Andreas Kerber (2017)

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DOI: 10.1016/J.MICROREL.2017.05.003

access: closed

type: Journal Article

metadata version: 2020-02-22

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Andreas Kerber:
Assessment of sense measurement duration on BTI degradation in MG/HK CMOS technologies using a novel stacked transistor test structure. Microelectron. Reliab. 73: 153-157 (2017)

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