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"Degradation analysis and current collapse imaging of AlGaN/GaN HEMTs by ..."
Takashi Katsuno et al. (2014)
- Takashi Katsuno, Takaaki Manaka, Tsuyoshi Ishikawa
, Hiroyuki Ueda, Tsutomu Uesugi, Mitsumasa Iwamoto:
Degradation analysis and current collapse imaging of AlGaN/GaN HEMTs by measurement of electric field-induced optical second-harmonic generation. Microelectron. Reliab. 54(9-10): 2227-2231 (2014)
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