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"Tiny-scale "stealth" current sensor to probe power semiconductor device ..."

Yuya Kasho et al. (2011)

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DOI: 10.1016/J.MICROREL.2011.06.015

access: closed

type: Journal Article

metadata version: 2020-02-22

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Yuya Kasho, Hidetoshi Hirai, Masanori Tsukuda, Ichiro Omura:
Tiny-scale "stealth" current sensor to probe power semiconductor device failure. Microelectron. Reliab. 51(9-11): 1689-1692 (2011)

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