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"High speed test interface module using MEMS technology."
Nabeeh Kandalaft, Ali Attaran, Rashid Rashidzadeh (2015)
- Nabeeh Kandalaft, Ali Attaran, Rashid Rashidzadeh:
High speed test interface module using MEMS technology. Microelectron. Reliab. 55(2): 374-382 (2015)
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