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"Accelerated assessment of fine-grain AVF in NoC using a Multi-Cell Upsets ..."

Jiajia Jiao, Yuzhuo Fu, Shi-Jie Wen (2014)

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DOI: 10.1016/J.MICROREL.2014.06.008

access: closed

type: Journal Article

metadata version: 2020-02-22

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Jiajia Jiao, Yuzhuo Fu, Shi-Jie Wen:
Accelerated assessment of fine-grain AVF in NoC using a Multi-Cell Upsets considered fault injection. Microelectron. Reliab. 54(11): 2629-2640 (2014)

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