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"Reliability/Uniformity improvement induced by an ultrathin TiO2 ..."
Ran Jiang, Zuyin Han, Xianghao Du (2016)
- Ran Jiang, Zuyin Han, Xianghao Du:
Reliability/Uniformity improvement induced by an ultrathin TiO2 insertion in Ti/HfO2/Pt resistive switching memories. Microelectron. Reliab. 63: 37-41 (2016)
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