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"Reliability improvement of InGaN LED backlight module by accelerated life ..."

Jae-Seong Jeong, Jin-Kyu Jung, Sang-Deuk Park (2008)

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DOI: 10.1016/J.MICROREL.2008.07.029

access: closed

type: Journal Article

metadata version: 2020-02-22

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Jae-Seong Jeong, Jin-Kyu Jung, Sang-Deuk Park:
Reliability improvement of InGaN LED backlight module by accelerated life test (ALT) and screen policy of potential leakage LED. Microelectron. Reliab. 48(8-9): 1216-1220 (2008)

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