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"Failure mechanism and reliability test method for USB interface circuitry ..."

Jae-Seong Jeong (2012)

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DOI: 10.1016/J.MICROREL.2012.07.017

access: closed

type: Journal Article

metadata version: 2020-02-22

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Jae-Seong Jeong:
Failure mechanism and reliability test method for USB interface circuitry on CPUs for mobile devices. Microelectron. Reliab. 52(9-10): 2014-2018 (2012)

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