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"Probabilistic fatigue damage estimation of embedded electronic solder ..."

Mayssam Jannoun et al. (2017)

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DOI: 10.1016/J.MICROREL.2017.08.005

access: closed

type: Journal Article

metadata version: 2023-08-06

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Mayssam Jannoun, Younes Aoues, Emmanuel Pagnacco, Philippe Pougnet, Abdelkhalak El Hami:
Probabilistic fatigue damage estimation of embedded electronic solder joints under random vibration. Microelectron. Reliab. 78: 249-257 (2017)

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