"Lock-in thermal laser stimulation for non-destructive failure localization ..."

Kristof J. P. Jacobs et al. (2017)

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DOI: 10.1016/J.MICROREL.2017.06.034

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type: Journal Article

metadata version: 2024-10-06

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Kristof J. P. Jacobs, T. Wang, Michele Stucchi, Mario Gonzalez, Kris Croes, Ingrid De Wolf, Eric Beyne:
Lock-in thermal laser stimulation for non-destructive failure localization in 3-D devices. Microelectron. Reliab. 76-77: 188-193 (2017)

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