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"Enhancement of RF-MEMS switch reliability through an active anti-stiction ..."
Jacopo Iannacci et al. (2010)
- Jacopo Iannacci
, A. Repchankova, Alessandro Faes, Augusto Tazzoli, Gaudenzio Meneghesso
, Gian-Franco Dalla Betta
:
Enhancement of RF-MEMS switch reliability through an active anti-stiction heat-based mechanism. Microelectron. Reliab. 50(9-11): 1599-1603 (2010)
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