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"Current-dependent hot-electron stresses on InGaP-gated and AlGaAs-gated ..."

Hou-Kuei Huang et al. (2006)

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DOI: 10.1016/J.MICROREL.2006.02.014

access: closed

type: Journal Article

metadata version: 2020-02-22

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Hou-Kuei Huang, Cieh-Pin Chang, Mau-Phon Houng, Yeong-Her Wang:
Current-dependent hot-electron stresses on InGaP-gated and AlGaAs-gated low noise PHEMTs. Microelectron. Reliab. 46(12): 2038-2043 (2006)

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