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"Analysis and modeling of passive device degradation for a long-term ..."
He Huang, Alexandre Boyer, Sonia Bendhia (2015)
- He Huang, Alexandre Boyer, Sonia Bendhia:
Analysis and modeling of passive device degradation for a long-term electromagnetic emission study of a DC-DC converter. Microelectron. Reliab. 55(9-10): 2061-2066 (2015)
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