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"Total ionizing dose effects in elementary devices for 180-nm flash ..."

Zhiyuan Hu et al. (2011)

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DOI: 10.1016/J.MICROREL.2011.03.026

access: closed

type: Journal Article

metadata version: 2020-02-22

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Zhiyuan Hu, Zhangli Liu, Hua Shao, Zhengxuan Zhang, Bingxu Ning, Ming Chen, Dawei Bi, Shichang Zou:
Total ionizing dose effects in elementary devices for 180-nm flash technologies. Microelectron. Reliab. 51(8): 1295-1301 (2011)

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