"Ultra-thin dielectric breakdown in devices and circuits: A brief review."

Chih-Hsiang Ho, Soo Youn Kim, Kaushik Roy (2015)

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DOI: 10.1016/J.MICROREL.2014.10.019

access: closed

type: Journal Article

metadata version: 2020-02-22

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Chih-Hsiang Ho, Soo Youn Kim, Kaushik Roy:
Ultra-thin dielectric breakdown in devices and circuits: A brief review. Microelectron. Reliab. 55(2): 308-317 (2015)

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