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"Transient analysis of latent damage formation in SMD capacitors by ..."
Dennis Helmut, Gerhard K. M. Wachutka, Gerhard Groos (2017)
- Dennis Helmut, Gerhard K. M. Wachutka, Gerhard Groos:
Transient analysis of latent damage formation in SMD capacitors by Transmission Line Pulsing (TLP). Microelectron. Reliab. 76-77: 97-101 (2017)
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