"A study of ageing effect at elevated temperature of flexible silicon ..."

Cory D. Heath et al. (2014)

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DOI: 10.1016/J.MICROREL.2014.01.018

access: closed

type: Journal Article

metadata version: 2020-02-22

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Cory D. Heath, Chau Dinh, C. Doran, S. S. Lau:
A study of ageing effect at elevated temperature of flexible silicon diodes integrated using conductive adhesives. Microelectron. Reliab. 54(5): 956-959 (2014)

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