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"A prognostic method for predicting failure of dc/dc converter."

Qingchuan He et al. (2017)

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DOI: 10.1016/J.MICROREL.2017.05.014

access: closed

type: Journal Article

metadata version: 2020-10-26

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Qingchuan He, Wenhua Chen, Jun Pan, Ping Qian:
A prognostic method for predicting failure of dc/dc converter. Microelectron. Reliab. 74: 27-33 (2017)

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