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"Failure mechanisms in advanced BCD technology during reliability ..."

J. G. van Hassel, G. A. D. Bock, G. van den Berg (2011)

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DOI: 10.1016/J.MICROREL.2011.07.043

access: closed

type: Journal Article

metadata version: 2020-02-22

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J. G. van Hassel, G. A. D. Bock, G. van den Berg:
Failure mechanisms in advanced BCD technology during reliability qualification. Microelectron. Reliab. 51(9-11): 1697-1700 (2011)

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