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"Investigation on marginal failure characteristics and related defects ..."

Claus Hartmann, M. Wieberneit (2009)

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DOI: 10.1016/J.MICROREL.2009.07.036

access: closed

type: Journal Article

metadata version: 2020-09-04

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Claus Hartmann, M. Wieberneit:
Investigation on marginal failure characteristics and related defects analysed by soft defect localization. Microelectron. Reliab. 49(9-11): 1137-1142 (2009)

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