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"A new electro-optical transmission-line measurement-method revealing a ..."

D. Hachem et al. (2018)

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DOI: 10.1016/J.MICROREL.2018.07.119

access: closed

type: Journal Article

metadata version: 2023-03-21

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D. Hachem, David Trémouilles, Frederic Morancho, Gaëtan Toulon:
A new electro-optical transmission-line measurement-method revealing a possible contribution of source and drain contact resistances to GaN HEMT dynamic on-resistance. Microelectron. Reliab. 88-90: 406-410 (2018)

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