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"Investigation of temperature variations on analog/RF and linearity ..."
Neha Gupta, Rishu Chaujar (2016)
- Neha Gupta, Rishu Chaujar:
Investigation of temperature variations on analog/RF and linearity performance of stacked gate GEWE-SiNW MOSFET for improved device reliability. Microelectron. Reliab. 64: 235-241 (2016)
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