"Total ionizing dose sensitivity of function blocks in FRAM."

Ke Gu et al. (2015)

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DOI: 10.1016/J.MICROREL.2015.03.001

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type: Journal Article

metadata version: 2023-09-24

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Ke Gu, Juin J. Liou, Wei Li, Yang Liu, Ping Li:
Total ionizing dose sensitivity of function blocks in FRAM. Microelectron. Reliab. 55(6): 873-878 (2015)

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