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"Optimum Si thickness for backside detection of photon emission using Si-CCD."

Arkadiusz Glowacki, Christian Boit, Philippe Perdu (2012)

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DOI: 10.1016/J.MICROREL.2012.06.143

access: closed

type: Journal Article

metadata version: 2020-02-22

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Arkadiusz Glowacki, Christian Boit, Philippe Perdu:
Optimum Si thickness for backside detection of photon emission using Si-CCD. Microelectron. Reliab. 52(9-10): 2031-2034 (2012)

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