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"Studying the effects of intermittent faults on a microcontroller."

Daniel Gil-Tomas et al. (2012)

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DOI: 10.1016/J.MICROREL.2012.06.004

access: closed

type: Journal Article

metadata version: 2020-12-29

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  - https://dblp.org/rec/journals/mr/Gil-TomasGBSG12
Daniel Gil-Tomas, Joaquin Gracia-Moran, Juan-Carlos Baraza-Calvo, Luis J. Saiz-Adalid, Pedro J. Gil-Vicente:
Studying the effects of intermittent faults on a microcontroller. Microelectron. Reliab. 52(11): 2837-2846 (2012)

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