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"Electrical noise and RTS fluctuations in advanced CMOS devices."

Gérard Ghibaudo, T. Boutchacha (2002)

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DOI: 10.1016/S0026-2714(02)00025-2

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/GhibaudoB02
Gérard Ghibaudo, T. Boutchacha:
Electrical noise and RTS fluctuations in advanced CMOS devices. Microelectron. Reliab. 42(4-5): 573-582 (2002)

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