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"A unified look at the use of successive differentiation and integration in ..."
Francisco J. García-Sánchez et al. (2015)
- Francisco J. García-Sánchez
, Adelmo Ortiz-Conde
, Juan Muci, Andrea Sucre-González, Juin J. Liou:
A unified look at the use of successive differentiation and integration in MOSFET model parameter extraction. Microelectron. Reliab. 55(2): 293-307 (2015)
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