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"Two-stage hot-carrier degradation behavior of 0.18 µm 18 V n-type ..."

Chao Gao et al. (2009)

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DOI: 10.1016/J.MICROREL.2008.09.009

access: closed

type: Journal Article

metadata version: 2023-09-30

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Chao Gao, Jun Wang, Lei Wang, Andrew Yap, Hong Li:
Two-stage hot-carrier degradation behavior of 0.18 µm 18 V n-type DEMOS and its recovery effect. Microelectron. Reliab. 49(1): 8-12 (2009)

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