"Use of high temperature operating life data to mitigate risks in ..."

Sanka Ganesan, Michael G. Pecht, Sharon Ling (2006)

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DOI: 10.1016/J.MICROREL.2004.12.019

access: closed

type: Journal Article

metadata version: 2020-02-22

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Sanka Ganesan, Michael G. Pecht, Sharon Ling:
Use of high temperature operating life data to mitigate risks in long-duration space applications that deploy commercial-grade plastic encapsulated semiconductor devices. Microelectron. Reliab. 46(2-4): 360-366 (2006)

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