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"Evolution of C-V and I-V characteristics for a commercial 600 V GaN ..."
Jian-Zhi Fu et al. (2018)
- Jian-Zhi Fu
, François Fouquet, Moncef Kadi, Pascal Dherbécourt:
Evolution of C-V and I-V characteristics for a commercial 600 V GaN GIT power device under repetitive short-circuit tests. Microelectron. Reliab. 88-90: 652-655 (2018)
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