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"Definition of curve fitting parameter to study tunneling and trapping of ..."

Valeriu Filip, Hei Wong, D. Nicolaescu (2006)

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DOI: 10.1016/J.MICROREL.2005.10.014

access: closed

type: Journal Article

metadata version: 2023-03-11

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Valeriu Filip, Hei Wong, D. Nicolaescu:
Definition of curve fitting parameter to study tunneling and trapping of electrons in Si/ultra-thin SiO₂/metal structures. Microelectron. Reliab. 46(7): 1027-1034 (2006)

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