Stop the war!
Остановите войну!
for scientists:
default search action
"Copper metallization influence on power MOS reliability."
Adeline Feybesse et al. (2003)
- Adeline Feybesse, Ivana Deram, Jean-Michel Reynes, Eric Moreau:
Copper metallization influence on power MOS reliability. Microelectron. Reliab. 43(4): 571-576 (2003)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.