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"Degradation mechanism analysis in temperature stress tests on III-V ..."

P. Espinet et al. (2010)

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DOI: 10.1016/J.MICROREL.2010.07.128

access: closed

type: Journal Article

metadata version: 2020-09-05

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  - https://dblp.org/rec/journals/mr/EspinetAGNV10
P. Espinet, Carlos Algora, José Ramón González, Neftalí Núñez, Manuel Vázquez:
Degradation mechanism analysis in temperature stress tests on III-V ultra-high concentrator solar cells using a 3D distributed model. Microelectron. Reliab. 50(9-11): 1875-1879 (2010)

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