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"Effect of power cycling tests on traps under the gate of ..."

Malika Elharizi et al. (2018)

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DOI: 10.1016/J.MICROREL.2018.07.070

access: closed

type: Journal Article

metadata version: 2021-02-05

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Malika Elharizi, Fadi Zaki, Ali Ibrahim, Zoubir Khatir, Jean-Pierre Ousten:
Effect of power cycling tests on traps under the gate of Al₂O₃/AlGaN/GaN normally-ON devices. Microelectron. Reliab. 88-90: 671-676 (2018)

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