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"Application of Scanning Probe Microscopy techniques in Semiconductor ..."

Bernd Ebersberger, Alexander Olbrich, Christian Boit (2001)

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DOI: 10.1016/S0026-2714(01)00187-1

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/EbersbergerOB01a
Bernd Ebersberger, Alexander Olbrich, Christian Boit:
Application of Scanning Probe Microscopy techniques in Semiconductor Failure Analysis. Microelectron. Reliab. 41(9-10): 1449-1458 (2001)

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