"Problem with no-clean flux spattering on in-circuit testing pads diagnosed ..."

Karel Dusek, David Busek (2016)

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DOI: 10.1016/J.MICROREL.2015.10.020

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type: Journal Article

metadata version: 2023-10-23

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Karel Dusek, David Busek:
Problem with no-clean flux spattering on in-circuit testing pads diagnosed by EDS analysis. Microelectron. Reliab. 56: 162-169 (2016)

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