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"Static and dynamic hot carrier accelerated TDDB: Influencing factors and ..."

Rainer Duschl et al. (2017)

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DOI: 10.1016/J.MICROREL.2017.06.051

access: closed

type: Journal Article

metadata version: 2020-02-22

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Rainer Duschl, Armin H. Fischer, Achim Gratz, Robert Wiesner:
Static and dynamic hot carrier accelerated TDDB: Influencing factors and impact on product lifetime. Microelectron. Reliab. 76-77: 149-153 (2017)

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