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"Accelerated active ageing test on SiC JFETs power module with silver ..."

Laurent Dupont et al. (2009)

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DOI: 10.1016/J.MICROREL.2009.07.050

access: closed

type: Journal Article

metadata version: 2024-01-25

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Laurent Dupont, Gerard Coquery, K. Kriegel, A. Melkonyan:
Accelerated active ageing test on SiC JFETs power module with silver joining technology for high temperature application. Microelectron. Reliab. 49(9-11): 1375-1380 (2009)

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