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"Multiple-time-instant 2D thermal mapping during a single ESD event."

Viktor Dubec et al. (2004)

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DOI: 10.1016/J.MICROREL.2004.07.087

access: closed

type: Journal Article

metadata version: 2022-03-16

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  - journals/mr/DubecBBHPDJSGG04
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  - https://dblp.org/rec/journals/mr/DubecBBHPDJSGG04
Viktor Dubec, Sergey Bychikhin, M. Blaho, Michael Heer, Dionyz Pogany, Marie Denison, Nils Jensen, Matthias Stecher, Gerhard Groos, Erich Gornik:
Multiple-time-instant 2D thermal mapping during a single ESD event. Microelectron. Reliab. 44(9-11): 1793-1798 (2004)

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